Scanning Probe Microscopy
Scanning Probe Microscopy
SPM
Scanning Probe Microscopy (SPM) analysis by LMA allows the customer to take full advantage of our world-leading expertise in determining structural, thermal, mechanical or electrical properties with nanoscale precision.
Scanning Probe Microscopy
SPM covers a wide range of techniques which use a probe to characterise and image sample morphology and surface or near-sub-surface properties.
When combined with beam-exit cross-sectional polishing (BEXP), SPM techniques can access internal sample structure and identify and measure properties at interfaces. Whether on the sample surface or in cross-section, LMA can provide access to a variety of different properties:
• Structural: sample morphology and dimensional analysis via materials sensitive contrast.
• Nanomechanical: sensitivity to near-surface changes in elastic moduli of materials, near-surface voids and delaminations.
• Nanothermal: sensitivity to thermal conductivity of materials.
• Nanoelectrical: sensitivity to local potential and electrical conductivity
LMA accesses SPMs based at Lancaster University's Physics Department. The majority of imaging and analysis is performed on Bruker (Veeco, Digital Instruments) MultiMode AFMs which have been modified in order to probe different sample properties.
Ultrasonic Force Microscopy (UFM) and Scanning Thermal Microscopy (SThM) have both been extensively deployed, tested and further developed at Lancaster University. LMA's links with Lancaster University's Physics Department allow us to access the expertise behind these methodologies.